標(biāo)準(zhǔn)號(hào) |
中文名稱 |
英文名稱 |
| DIN 50131-1974 |
金屬材料的檢驗(yàn).收縮率測定法 |
(Testing of Metallic Materials; Determination of Shrinkage) |
| DIN 50141-1982 |
金屬材料的檢驗(yàn)；剪切試驗(yàn) |
(Testing of metals; Shear test) |
| DIN 50142-1982 |
金屬材料的檢驗(yàn)；扁平彎曲振動(dòng)試驗(yàn) |
(Testing of metallic materials; Flat bending fatigue test) |
| DIN 50148-1975 |
有色金屬壓鑄件的拉伸試驗(yàn) |
(Tensile test pieces for non-ferrous metals pressure die castings) |
| DIN 50150-2000 |
金屬材料試驗(yàn).硬度值的換算 |
(Testing of metallic materials - Conversion of hardness values) |
| DIN 50154-1980 |
對厚度在0.179mm以下的鋁和鋁塑性合金薄膜和帶材進(jìn)行不作微調(diào)拉伸測量的拉力試驗(yàn) |
(Tensile test without extensometer on foils and strips of aluminium and wrought aluminium alloys with a thickness up to 0,179 mm) |
| DIN 5016-1994 |
商務(wù)表格.供貨計(jì)劃表 |
(Business forms - Delivery schedule) |
| DIN 50162-1978 |
鍍層鋼的檢驗(yàn).剪切試驗(yàn)中鍍層材料與母體材料之間的粘附剪切強(qiáng)度的測定 |
(Testing of clad steels; determination of shear strength between cladding metal and parent metal in shear test) |
| DIN 50165-1994 |
金屬材料試驗(yàn).點(diǎn)焊連接的抗振強(qiáng)度試驗(yàn) |
(Testing of metallic materials - Vibration strength test on single spot welding joints) |
| DIN 5017-1992 |
業(yè)務(wù)表格.檢驗(yàn)報(bào)告 |
(Business forms; inspection report) |
| DIN 5018-1994 |
商務(wù)表格.發(fā)貨定單 |
(Business forms - Despatch order) |
| DIN 5018-2004 |
商務(wù)表格.貨物發(fā)送細(xì)則 |
|
| DIN 5019-1998 |
商務(wù)表格.集合發(fā)票 |
(Business forms - Collective invoice) |
| DIN 50190-2-1979 |
熱處理件的硬化深度.表面淬火硬化深度的測定 |
(Hardness depth of heat-treated parts; determination of the effective depth of hardening after flame or induction hardening) |
| DIN 50190-3-1979 |
熱處理件的硬化深度.氮化處理硬化深度的測定 |
(Hardness depth of heat-treated parts; determination of the effective depth of hardening after nitriding) |
| DIN 50190-4-1999 |
激光技術(shù).熱處理件的硬化深度.第4部分:熔煉硬化深度和熔煉深度的測定 |
(Hardness depth of heat-treated parts - Part 4: Determination of the fusion hardening depth and the fusion depth) |
| DIN 50192-1977 |
脫碳深度的測定 |
(Determination of depth of decarburization) |
| DIN 502-1973 |
傳動(dòng)件.用兩個(gè)螺釘緊固的法蘭軸承 |
(Driving Components; Flanged Bearings, Fastened with 2 Screws) |
| DIN 502-2004 |
傳動(dòng)件.用兩個(gè)螺釘緊固的法蘭軸承 |
|
| DIN 5023-1989 |
涂蓋色料用顏料盒 |
(Painting box with opaque colours) |
| DIN 50280-1975 |
向心滑動(dòng)軸承的運(yùn)行試驗(yàn).概述 |
(Running Test on Radial Plain Bearings; General) |
| DIN 50282-1979 |
滑動(dòng)軸承.金屬滑動(dòng)材料的摩擦特性.特性概念 |
(Plain Bearings; The Tribological Behaviour of Metallic Antifriction Materials; Significant Definitions) |
| DIN 503-1973 |
傳動(dòng)件.用四個(gè)螺釘緊固的法蘭軸承 |
(Driving Components; Flanged Bearings, Fastened with 4 Screws) |
| DIN 503-2004 |
傳動(dòng)件.用四個(gè)螺釘緊固的法蘭軸承 |
|
| DIN 5030-1-1985 |
輻射的光譜測量.概念.量.參數(shù) |
(Spectral measurement of radiation; terminology, quantities, characteristic values) |
| DIN 5030-2-1982 |
輻射的光譜測量.光譜測量的光源.選擇標(biāo)準(zhǔn) |
(Spectral measurement of radiation; radiation sources; selection criteria) |
| DIN 5030-3-1984 |
輻射的光譜測量.光譜分離.概念及特性標(biāo)志 |
(Spectral measurement of radiation; spectral isolation; definitions and characteristics) |
| DIN 5030-5-1987 |
輻射光譜的測量.光譜輻射測量用物理的接收器.概念.特性值.選擇依據(jù) |
(Spectral measurement of radiation; physical detectors for spectral measurement of radiation; terminology, characteristic quantities, selection criteria) |
| DIN 5031 Bb.1-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)和照明技術(shù).DIN5031T.1-T.10的量.公式符號(hào).單位及主題詞索引 |
(Optical radiation physics and illumination engineering; quantities, symbols and units; table of contents and catchword index to DIN 5031) |
| DIN 5031-1-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)和照明技術(shù).量.公式符號(hào)幅射物理單位 |
(Optical radiation physics and illuminating engineering; quantities, symbols and units of radiation physics) |
| DIN 5031-10-2000 |
光輻射物理學(xué)和照明技術(shù).第10部分:光生物學(xué)上的有效輻射、量、公式符號(hào)和作用 |
(Optical radiation physics and illuminating engineering - Part 10: Photobiologically effective radiation, quantities, symbols and actions) |
| DIN 5031-2-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).用接收器評(píng)定輻射 |
(Optical radiation physics and illuminating engineering; evaluation of radiation by different detectors) |
| DIN 5031-3-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).照明技術(shù)的量.符號(hào)及單位 |
(Optical radiation physics and illuminating engineering; quantities, symbols and units of illuminating engineering) |
| DIN 5031-4-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).效率 |
(Physics of radiation in the field of optics and illuminating engineering; efficiencies) |
| DIN 5031-5-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).溫度概念 |
(Physics of radiation in the field of optics and illuminating engineering; definitions for temperatures) |
| DIN 5031-6-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).以瞳孔光強(qiáng)作為網(wǎng)膜照度的量度 |
(Physics of radiation in the field of optics and illuminating engineering; pupil intensity as a measure of retinal illumination) |
| DIN 5031-7-1984 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).波長范圍的名稱 |
(Optical radiation physics and illumination engineering; terms for wavebands) |
| DIN 5031-8-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).輻射物理學(xué)的概念和常數(shù) |
(Physics of radiation in the field of optics and illuminating engineering; definitions and constants of radiation physics) |
| DIN 5031-9-1982 |
光學(xué)范圍內(nèi)的輻射物理學(xué)及照明技術(shù).有關(guān)發(fā)光的概念 |
(Physics of radiation in the field of optics and illuminating engineering; definitions in the field of luminescence) |
| DIN 50312-1977 |
噴丸檢驗(yàn).壓力噴射用檢驗(yàn)箱 |
(Testing of abrasives; test cabin for pressure-type blasting) |
| DIN 50315-1988 |
金屬離心噴射試驗(yàn).磨損試驗(yàn).效果檢驗(yàn) |
(Testing the wear and effectiveness of metallic abrasives by centrifugal blasting) |
| DIN 5032-1-1999 |
光測量.第1部分:光度測量法 |
(Photometry - Part 1: Methods of measurement) |
| DIN 5032-2-1992 |
光測量.電燈照明和相關(guān)量值的測量 |
(Photometry; operation of electric lamps and measurement of the respective quantities) |
| DIN 5032-3-1976 |
光測量.氣體光源的測量條件 |
(Photometry; terms of measurement on gas luminaires) |
| DIN 5032-4-1999 |
光測量.第4部分:光源測量 |
(Photometry - Part 4: Measurement of luminaires) |
| DIN 5032-6-1985 |
光測量.光度計(jì).概念.特性及其標(biāo)志 |
(Photometry; photometers; concepts, characteristics and their designation) |
| DIN 5032-7-1985 |
光測量.照明強(qiáng)度和照明密度的分級(jí) |
(Photometry; classification of illuminance meters and luminance meters) |
| DIN 5032-8-1986 |
光測量.照明強(qiáng)度測量設(shè)備用的數(shù)據(jù)表 |
(Photometry; data-sheet for illuminance-meters) |
| DIN 5033-1-1979 |
色度測定.色度基本概念 |
(Colorimetry; basic concepts) |
| DIN 5033-2-1992 |
色度測定.標(biāo)準(zhǔn)色價(jià)系統(tǒng) |
(Colorimetry; standard colorimetric systems) |
| DIN 5033-3-1992 |
色度測量.色度數(shù) |
(Colorimetry; colorimetric measures) |
| DIN 5033-4-1992 |
色度測量.光譜法 |
(Colorimetry; spectrophotometric method) |
| DIN 5033-5-1981 |
色度測定.目測比色法 |
(Colorimetry by visual matching) |
| DIN 5033-6-1976 |
色度測定.三色法 |
(Colorimetry; tristimulus method) |
| DIN 5033-7-1983 |
色度測定.物體色的測量條件 |
(Colorimetry; measuring conditions for object colours) |
| DIN 5033-8-1982 |
色度測定.光源的測量條件 |
(Colorimetry; measuring conditions for light sources) |
| DIN 5033-9-1982 |
色度測定.色度測定和光度測定的白色標(biāo)準(zhǔn) |
(Colorimetry; reflectance standard for colorimetry and photometry) |
| DIN 5033-9-2005 |
色度測量.第9部分:色度測量和光度測量的校準(zhǔn)用反射標(biāo)準(zhǔn) |
|
| DIN 5034-1-1999 |
室內(nèi)日光照明.第1部分:一般要求 |
(Daylight in interiors - Part 1: General requirements) |
| DIN 5034-2-1985 |
室內(nèi)日光照明.原理 |
(Daylight in interiors; principles) |
| DIN 5034-3-1994 |
室內(nèi)日光照明.第3部分:計(jì)算 |
(Daylight in interiors - Part 3: Calculation) |
| DIN 5034-4-1994 |
室內(nèi)日光照明.第4部分:居室最小窗戶尺寸的簡化測定 |
(Daylight in interiors - Part 4: Simplified determination of minimum window sizes for dwellings) |
| DIN 5034-5-1993 |
室內(nèi)日光照明.測量 |
(Daylight in interiors; measurement) |
| DIN 5034-6-1995 |
室內(nèi)日光照明.屋頂天窗采光孔的有用尺寸的簡要規(guī)定 |
(Daylight in interiors - Part 6: Simplified determination of suitable dimensions for rooflights) |
| DIN 5035-6-1990 |
室內(nèi)人工照明.測量和評(píng)定 |
(Artificial lighting; measurement and evaluation) |
| DIN 5035-7-2004 |
人工照明.第7部分:帶可視工作站的室內(nèi)照明 |
|
| DIN 5035-8-1994 |
人工照明.辦公室和類似辦公室的房間中個(gè)別場所照明的特殊要求 |
(Artificial lighting; special requirements for the lighting of single work-places in offices and similar rooms) |
| DIN 5036 Bb.1-1980 |
材料的輻射物理學(xué)性能和光技術(shù)性能.目次和主題詞索引 |
(Radiometric and photometric properties of materials; table of content, catchword index) |
| DIN 5036-1-1978 |
材料的輻射物理學(xué)性能和光技術(shù)性能.概念.特性值 |
(Radiometric and photometric properties of materials; definitions characteristics) |
| DIN 5036-3-1979 |
材料的輻射物理學(xué)性能和光技術(shù)性能.光技術(shù)和光譜幅射物理學(xué)參數(shù)的測量方法 |
(Radiometric and photometric properties of materials; methods of measurement for photometric and spectral radiometric characteristics) |
| DIN 5036-4-1977 |
材料的輻射物理學(xué)性能和光技術(shù)性能.分級(jí) |
(Radiometric and photometric properties of materials; classification) |
| DIN 5037 Bb.1-1992 |
聚光燈的光學(xué)鑒定.電影、電視和旋轉(zhuǎn)對稱光線強(qiáng)度分配的舞臺(tái)聚光燈的合理可用光鑒定 |
(Photometric evaluation of projectors; simplified evaluation of projectors with rotationally symmetrical luminous intensity distribution for the use in film and television studios and stages) |
| DIN 5037 Bb.2-1992 |
聚光燈的光學(xué)鑒定.帶一個(gè)或兩個(gè)對稱光強(qiáng)度分布的電影、電視和舞臺(tái)聚光燈合理的可用光的鑒定 |
(Photometric evaluation of projectors; simplified evaluation of projectors with non-rotationally symmetrical luminous intensity distribution for use in film and television studios and stages) |
| DIN 5039-1995 |
光.燈.光源.概念.分類 |
(Light, lamps, luminaires - Definitions, survey) |
| DIN 504-1973 |
傳動(dòng)件.套筒軸承 |
(Driving Components; Eye-mounted Bearings) |
| DIN 504-2004 |
傳動(dòng)件.套筒軸承 |
|
| DIN 5040-1-1976 |
照明用燈.光技術(shù)標(biāo)志和分類 |
(Luminaires (lighting fittings); classification) |
| DIN 5040-2-1995 |
照明用燈.第2部分:室內(nèi)照明燈.概念.分類 |
(Luminaires (lighting fittings) - Part 2: Luminaires for interior lighting; concepts, classification) |
| DIN 5040-3-1977 |
照明用燈.室外照明燈.概念.分類 |
(Luminaires (lighting fittings); luminaires for outdoor lighting, concepts, classification) |
| DIN 5040-4-1999 |
照明用燈.第4部分:照明探照燈.術(shù)語和光技術(shù)評(píng)估值 |
(Luminary for lighting purposes - Part 4: Flood lights, terms and quantities of assessment) |
| DIN 5042-1-1980 |
燃?xì)鉄艉兔簹鉄?分類.概念 |
(Gaslamps and lighting fittings; definition, classification) |
| DIN 5042-2-1974 |
燃?xì)鉄艉兔簹鉄?陶瓷噴嘴.尺寸 |
(Gaslamps and lighting fittings; ceramic mouthpieces) |
| DIN 5042-3-1980 |
燃?xì)鉄艉兔簹鉄?白熾燈罩.尺寸 |
(Gaslamps and lighting fittings; incandescent mantle) |
| DIN 5042-4-1994 |
燃?xì)鉄艉兔簹鉄?街道照明用白熾燈罩.要求和檢驗(yàn) |
(Combustion lamps and gas luminaires; incandescent mantle for roadlighting; requirements and testing) |
| DIN 5042-5-1979 |
燃?xì)鉄艉兔簹鉄?點(diǎn)火噴嘴.吊掛結(jié)構(gòu):A型 |
(Gaslamps and lighting fittings; ignition burner, hanging structure) |
| DIN 5042-6-1979 |
燃?xì)鉄艉兔簹鉄?點(diǎn)火噴嘴.立式結(jié)構(gòu) |
(Gaslamps and lighting fittings; ignition burner, upright structure) |
| DIN 5042-7-1988 |
燃?xì)鉄艉兔簹鉄?固定噴嘴 |
(Combustion lamps and gas luminaires; fixed nozzles) |
| DIN 5042-8-1985 |
燃?xì)鉄艉兔簹鉄?空氣調(diào)節(jié)用噴射管和鎖緊螺母 |
(Combustion lights and gas lights; injector jet pipes and air control screws) |
| DIN 5043-1-1973 |
放射性發(fā)光顏料與發(fā)光染料.發(fā)光密度的測量條件和顏料符號(hào) |
(Radioactive luminous pigments; methods of mesurement and designation) |
| DIN 5043-2-1978 |
放射性發(fā)光顏料與發(fā)光染料.發(fā)光密度的測量條件和發(fā)光染料的符號(hào) |
(Radioactive luminescent pigments and paints; method of measurement of luminance and designation of luminescent paints) |
| DIN 50431-1988 |
半導(dǎo)體工藝材料的檢驗(yàn).用探針線性排列的四探針直流法測量單晶硅或鍺的電阻率 |
(Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array) |
| DIN 50433-1-1976 |
無機(jī)半導(dǎo)體材料的檢驗(yàn).用X射線測向儀測定單晶體取向 |
(Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction) |
| DIN 50433-2-1976 |
無機(jī)半導(dǎo)體材料的檢驗(yàn).用反射光影法測定單晶體取向 |
(Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of optical reflection figure) |
| DIN 50433-3-1982 |
半導(dǎo)體材料的檢驗(yàn).用勞埃反射法測定單晶體取向 |
(Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering) |
| DIN 50434-1986 |
半導(dǎo)體材料的檢驗(yàn).單晶硅試樣的(111)和(100)蝕面上晶體結(jié)構(gòu)缺陷的測定 |
(Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on 111 and 100 surfaces) |
| DIN 50435-1988 |
半導(dǎo)體工藝材料的檢驗(yàn).用探針?biāo)奶结樦绷鞣y量硅片和鍺片電阻率的徑向變化 |
(Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method) |
| DIN 50437-1979 |
無機(jī)半導(dǎo)體材料的檢驗(yàn).用紅外線干涉法測量硅外延生長層的的厚度 |
(Testing of semi-conductive inorganic materials; measuring the thickness of silicon epitaxial layer thickness by infrared interference method) |
| DIN 50438-1-1995 |
半導(dǎo)體工藝材料的檢驗(yàn).用紅外線吸收法測量硅中雜質(zhì)含量.第1部分:氧 |
(Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen) |
| DIN 50438-2-1982 |
半導(dǎo)體工藝材料的檢驗(yàn).用紅外線吸收法測量硅中雜質(zhì)含量.碳 |
(Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon) |
| DIN 50438-3-2000 |
半導(dǎo)體工藝材料的試驗(yàn).用紅外線吸收法測量硅中雜質(zhì)含量.第3部分:硼和磷 |
(Testing of materials for use in semiconductor technology - Determination of impurity content silicon by infrared absorption - Part 3: Boron and phosphorus) |
| DIN 50439-1982 |
半導(dǎo)體工藝材料的檢驗(yàn).用電容--電壓法和水銀接點(diǎn)確定晶朊半導(dǎo)體材料中摻雜物的斷面 |
(Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact) |
| DIN 5044-1-1981 |
固定交通照明.汽車交通的道路照明.一般質(zhì)量特性和標(biāo)準(zhǔn)值 |
(Stationary traffic lighting; street lighting for automobile traffic) |
| DIN 5044-2-1982 |
固定交通照明.汽車交通的道路照明.計(jì)算和測量 |
(Stationary traffic lighting; street lighting for automobile traffic; calculation and measurement) |
| DIN 50440-1998 |
半導(dǎo)體工藝材料的檢驗(yàn).測量硅單晶中載流子壽命.用光電導(dǎo)法在微小噴射時(shí)測量復(fù)合載流子壽命 |
(Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method) |
| DIN 50441-1-1996 |
半導(dǎo)體工藝材料的檢驗(yàn).半導(dǎo)體片幾何尺寸的測量.第1部分:厚度和厚度變動(dòng) |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation) |
| DIN 50441-2-1998 |
半導(dǎo)體工藝材料的檢驗(yàn).半導(dǎo)體芯片幾何尺寸的測量.第2部分:棱角剖面的檢驗(yàn) |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile) |
| DIN 50441-3-1985 |
半導(dǎo)體工藝材料的檢驗(yàn).半導(dǎo)體片幾何尺寸的測量.用多射線干涉法測定拋光片表面的平面偏差 |
(Testing of materials for semiconductor technology; measurement of the geometric dimensions of semiconductor slices; determination of flatness deviation of polished slices by means of the multiple beam interference) |
| DIN 50441-4-1999 |
半導(dǎo)體工藝用材料的檢驗(yàn).半導(dǎo)體圓片幾何尺寸的測量.第4部分:圓片直徑,直徑變化,扁片直徑,扁片長度和扁片厚 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth) |
| DIN 50441-5-2001 |
半導(dǎo)體工藝材料的試驗(yàn).半導(dǎo)體片幾何尺寸的測定.第5部分:形狀和平整度偏差的術(shù)語 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation) |
| DIN 50442-1-1981 |
無機(jī)半導(dǎo)體材料的檢驗(yàn).圓形單晶體半導(dǎo)體片表面結(jié)構(gòu)的測定.鋸切和研磨的薄片 |
(Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slices) |
| DIN 50443-1-1988 |
半導(dǎo)體工藝材料的檢驗(yàn).用X射線外形測量法證明半導(dǎo)體單晶體中晶體缺陷和不均勻性.硅 |
(Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography) |
| DIN 50443-2-1994 |
半導(dǎo)體工藝用材料的檢驗(yàn).用X射線局部剖析法在半導(dǎo)體單晶中驗(yàn)證晶體缺陷和不均勻性.III-V-連接式半導(dǎo)體 |
(Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds) |
| DIN 50445-1992 |
半導(dǎo)體工藝材料檢驗(yàn).用渦流法無接觸測定特種電阻.均勻摻雜半導(dǎo)體片 |
(Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers) |
| DIN 50446-1995 |
半導(dǎo)體工藝材料的檢驗(yàn).硅晶體外延層中缺陷種類和缺陷密度測定 |
(Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers) |
| DIN 50447-1995 |
半導(dǎo)體工藝材料的檢驗(yàn).用渦流法無接觸測量半導(dǎo)體層的表面電阻 |
(Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method) |
| DIN 50448-1998 |
半導(dǎo)體工藝材料的檢驗(yàn).用電容試探器無接觸測量半絕緣半導(dǎo)體圓片 |
(Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe) |
| DIN 50449-1-1997 |
半導(dǎo)體工藝用材料的檢驗(yàn).通過紅外線吸收在Ⅲ-Ⅴ-連接半導(dǎo)體中雜質(zhì)含量的測定.第1部分:砷化鎵中的碳素 |
(Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 1: Carbon in gallium arsenide) |
| DIN 50449-2-1998 |
半導(dǎo)體工藝用材料的檢驗(yàn).通過紅外線吸收在Ⅲ-Ⅴ-連接半導(dǎo)體中雜質(zhì)含量的測定.第2部分:砷化鎵中的硼 |
(Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide) |
| DIN 50450-1-1987 |
半導(dǎo)體工藝材料的檢驗(yàn).載運(yùn)氣體和混合氣體中雜質(zhì)的測定.用五氧化二磷電池測定氫.氧.氮.氙和氦中的水雜質(zhì) |
(Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell) |
| DIN 50450-2-1991 |
半導(dǎo)體工藝材料的檢驗(yàn).載運(yùn)氣體和混合氣體中雜質(zhì)的測定.用原電池測定氮.氬.氦.氖.氫中的氧雜質(zhì) |
(Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N, Ar, He, Ne and H by using a galvanic cell) |
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