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| 編號 | 中文名稱 | 英文名稱 |
|---|---|---|
| BS 3828 | 石英玻璃規(guī)范 | Specification for crystal glass |
| BS 6711-1 | 主要由玻璃、瓷料或透明石英制作的實(shí)驗(yàn)室器皿相關(guān)詞匯.第1部分:器皿項(xiàng)目名稱 | Vocabulary relating to laboratory apparatus made essentially from glass, porcelain or vitreous silica - Names for items of apparatus |
| BS 9612 N004 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、47 U/2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.寬溫范圍 | Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N005 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.窄溫范圍(非溫控) | Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode , AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level |
| BS 9612 N006 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、47U/2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的 | Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N008 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼、50至125MHz頻率規(guī)范.寬溫范圍(非溫控)操作用第五諧 | Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N009 | 經(jīng)質(zhì)量評定的振蕩器用冷焊封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼,50至125MHz頻率規(guī)范.窄溫范圍(非溫控)操 | Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level |
| BS 9612 N010 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DP外殼、6.0至25MHz頻率范圍.寬溫范圍(非溫控)操作的基波厚度剪切模 | Detail specification for cold welded seal quartz crystal units for oscillator applications - DK enclosure, 6.0 to 25 MHz frequency range - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N016 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.寬溫范圍(非 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N017 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.窄溫范圍(非 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level |
| BS 9612 N018 | 振蕩器用電阻焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N019 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.窄溫范圍(非溫控)操作的第 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level |
| BS 9612 N020 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的第 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level |
| BS 9612 N021 | 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、50至125MHz頻率范圍.窄溫范圍(溫控)操作的第五 | Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level |
| BS 9617 | 經(jīng)質(zhì)量評估的石英晶體振子詳細(xì)規(guī)范的制定規(guī)則.全面評估級 | Rules for the preparation of detail specifications for quartz crystal units of assessed quality - Full assessment level |
| BS 9625 | 經(jīng)質(zhì)量評定的石英晶體振蕩器空白詳細(xì)規(guī)范.全面評定級 | Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level |
| BS EN 12904 | 人類生活用水處理用制品.石英砂和石英礫石 | Products used for treatment of water intended for human consumption - Silica sand and silica gravel |
| BS EN 168100 | 電子元器件質(zhì)量評定協(xié)調(diào)體系.石英晶體器件的分規(guī)范.(性能驗(yàn)收) | Harmonized system of quality assessment for electronic components - Sectional specification: quartz crystal units (capability approval) |
| BS EN 168101 | 電子元器件質(zhì)量保證協(xié)調(diào)體系.空白詳細(xì)規(guī)范.石英晶體部件(性能認(rèn)可) | Harmonized system of quality assessment for electronic components - Blank detail specification: quartz crystal units (capability approval) |
| BS EN 168200 | 電子元器件質(zhì)量評定協(xié)調(diào)系統(tǒng).分規(guī)范:石英晶體部件(合格鑒定批準(zhǔn)) | Harmonized system of quality assessment for electronic components - Sectional specification: quartz crystal units (qualification approval) |
| BS EN 168201 | 電子元器件的質(zhì)量評估協(xié)調(diào)體系.空白詳細(xì)規(guī)范.石英晶體元件(資格認(rèn)可) | Harmonized system of quality assessment for electronic components - Blank detail specification - Quartz crystal units - (Qualification approval) |
| BS EN 60122-1 | 經(jīng)質(zhì)量評定的石英晶體元件.總規(guī)范 | Quartz crystal units of assessed quality - Generic specification |
| BS EN 60122-3 | 質(zhì)量評定的石英晶體元件.標(biāo)準(zhǔn)外形和引線連接器 | Quartz crystal units of assessed quality - Standard outlines and lead connections |
| BS EN 60444-1 | 石英晶體單元參數(shù)的測量.第1部分:用π型網(wǎng)絡(luò)零相位技術(shù)測量石英晶體單元諧振頻率和諧振電阻的基本方法 | Measurement of quartz crystal unit parameters - Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network |
| BS EN 60444-2 | 石英晶體元件參數(shù)的測定.第2部分:用相位偏離法測量石英晶體單元的動態(tài)電容 | Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units |
| BS EN 60444-3 | 石英晶體器件參數(shù)的測定.第3部分:用與并聯(lián)電容量Co補(bǔ)償相連的π網(wǎng)絡(luò)相位技術(shù)測量200MHz以下的石英器件的兩 | Measurement of quartz crystal unit parameters - Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a -network with compensation of the parallel capacitance C0 |
| BS EN 60444-4 | 石英晶體元件參數(shù)測量.第4部分:30MHz以下石英晶體元件負(fù)荷諧振頻率fL.負(fù)荷諧振電阻R1測量方法,以及石英晶體 | Measurement of quartz crystal unit parameters - Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| BS EN 60444-5 | 石英晶體元件參數(shù)測量.第5部分:用自動網(wǎng)絡(luò)分析儀和誤差修正技術(shù)測定等效電氣參數(shù) | Measurement of quartz crystal unit parameters - Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| BS EN 60444-6 | 石英晶體元件參數(shù)測量.驅(qū)動級相關(guān)性測量 | Measurement of quartz crystal unit parameters - Measurement of drive level dependence (DLD) |
| BS EN 60444-7 | 石英晶體元件參數(shù)的測量.石英晶體元件的活性和頻率下降的測量 | Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units |
| BS EN 60444-8 | 石英晶體元件參數(shù)的測量.表面安裝石英晶體元件用試驗(yàn)裝置 | Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units |
| BS EN 60444-9 | 石英晶體元件參數(shù)測量.壓電晶體元件寄生振蕩測量 | Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units |
| BS EN 60455-3-2 | 電氣絕緣用樹脂基反應(yīng)性復(fù)合物.單項(xiàng)材料規(guī)范.填石英的環(huán)氧樹脂復(fù)合物.第2活頁:填石英的環(huán)氧樹脂復(fù)合物 | Resin based reactive compounds used for electrical insulation - Specifications for individual materials - Quartz filled epoxy resinous compounds - Sheet 2: Quartz filled epoxy resinous compounds |
| BS EN 60679-1 | 經(jīng)質(zhì)量評定的石英晶體控制振蕩器.總規(guī)范 | Quartz crystal controlled oscillators of assessed quality - Generic specification |
| BS EN 60679-3 | 經(jīng)質(zhì)量評定的石英晶體控制振蕩器.標(biāo)準(zhǔn)外形和引線連接 | Quartz crystal controlled oscillators of assessed quality - Standard outlines and lead connections |
| BS EN 60679-4-1 | 經(jīng)質(zhì)量評估的石英晶體受控振蕩器.空白詳細(xì)規(guī)范.能力認(rèn)可 | Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Capability approval |
| BS EN 60679-4 | 經(jīng)質(zhì)量評定的石英晶體受控振蕩器.分規(guī)范.能力認(rèn)可 | Quartz crystal controlled oscillators of assessed quality - Sectional specification - Capability approval |
| BS EN 60679-5-1 | 經(jīng)質(zhì)量評估的石英晶體受控振蕩器.空白詳細(xì)規(guī)范.合格鑒定 | Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Qualification approval |
| BS EN 60679-5 | 經(jīng)質(zhì)量評估的石英晶體受控振蕩器.分規(guī)范.合格鑒定 | Quartz crystal controlled oscillators of assessed quality - Sectional specification - Qualification approval |
| BS EN 60682 | 石英鹵鎢燈燈夾溫度測量方法 | Method for measuring the pinch temperature of quartz-tungsten-halogen lamps |
| BS EN 60758 | 人造石英晶體.規(guī)范和使用指南 | Synthetic quartz crystal - Specifications and guide to the use |
| BS EN ISO 10650-1 | 牙科學(xué).動力聚合活化劑.石英鎢鹵素?zé)? | Dentistry - Powered polymerization activators - Quartz tungsten halogen lamps |
| BS EN ISO 3262-13 | 涂料填充劑.規(guī)范和試驗(yàn)方法.天然石英(地) | Extenders for paints - Specifications and methods of test - Natural quartz (ground) |
| BS EN ISO 3262-15 | 涂料填充劑.規(guī)范和試驗(yàn)方法.透明石英 | Extenders for paints - Specifications and methods of test - Vitreous silica |
| BS EN ISO 3262-19 | 涂料填充劑.規(guī)范和試驗(yàn)方法.沉淀石英砂 | Extenders for paints - Specifications and methods of test - Precipitated silica |
| BS EN ISO 3262-20 | 涂料填充劑.規(guī)范和試驗(yàn)方法.煙化石英砂 | Extenders for paints - Specifications and methods of test - Fumed silica |
| BS EN ISO 3262-21 | 涂料填充劑.規(guī)范和試驗(yàn)方法.石英砂(未磨碎天然石英) | Extenders for paints - Specifications and methods of test - Silica sand (unground natural quartz) |
| BS ISO 10553 | 鐘表學(xué).石英表準(zhǔn)確度評價(jià)規(guī)程 | Horology - Procedure for evaluating the accuracy of quartz watches |
| 編號 | 中文名稱 | 英文名稱 |