�������
��(bi��o)��(zh��n)̖��IEC 62047-6
|
��(bi��o)��(zh��n)��(bi��o)�}��Semiconductor devices �C Micro-electromechanical devices �C Part 6: Axial fatigue testing methods of thin film materials - Edition 1.0
|
�l(f��)���r�g��2009.04.01
������(bi��o)��(zh��n)�l(f��)���r�gՈ(li��n)ϵ�����ˆT�_�J(r��n)��|
퓔�(sh��)��34pages
��ע����(bi��o)��(zh��n)�@ʾ0퓱�ʾδ��(bi��o)ע����Ҫ�c�����ˆT�_�J(r��n)��|
��ע����(bi��o)��(zh��n)��Ч�Լ�������rՈ(li��n)ϵ�����ˆT������(li��n)ϵ
�����Л]�����б���,Ո����ԃ��,�������r�؏�(f��)|
Copyright 2008 Worldwide Translation.
�����·��g��˾���(qu��n)����.Tel:010-69735438
